Patents

Patents

1. “Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids”(Allowed September 1996. USA patent No. 5,667,300)
   Inventors: Andreas Mandelis and Mahendra Munidasa.

   2. “Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids”(Allowed in Canada March 27, 2001, patent No. 2,126,481)350
   Inventors: Andreas Mandelis, Mahendra Munidasa, and D. wolf.

   3. “Non-Contact Photothermal Methods for Measuring In-Situ Thermal Diffusivity of Solids”(Allowed September 16, 1997.
   USA patent No. 5, 667, 300)
   Inventors: Andreas Mandelis and Mahendra Munidasa.

   4. “Non-contact photothermal radiometric metrologies and instrumentation for characterization of semiconductor wafers, devices and non electronic materials” (Full patent application submitted to Canada, April 17, 2000) Inventors: Andreas Mandelis, Jose A. Garcia, Lena Nicolaides, Mario Rodriguez, Stefano Pauloni.

   5. “Method of Photo-Carrier Radiometry of semiconductors” Submitted to the USA and PCT patent offices, March, 2002 and 2003. Inventors: Andreas Mandelis, D. Shaugnessy, Jerias A. Batista, and Jose A. Garcia.